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X-ray standing wave microscopy: Chemical microanalysis with atomic resolution
Authors: Drakopoulos, M.; Zegenhagen, J.; Snigirev, A.; Snigireva, I.; Hauser, M.; Eberl, K.; Aristov, V.; Shabelnikov, L.; Yunkin, V.
Date of Publication (YYYY-MM-DD): 2002
Title of Journal: Applied Physics Letters
Volume: 81
Issue / Number: 12
Start Page: 2279
End Page: 2281
Document Type: Article
ID: 7181.0
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