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Influence of point defects on the optical properties of self-assembled Ge/Si hut clusters
Authors: Nguyen-Duc, T. K.; Le Thanh, V.; Yam, V.; Boucaud, P.; Bouchier, D.; Schmidt, O. G.; Derrien, J.
Date of Publication (YYYY-MM-DD): 2006
Title of Journal: Thin Solid Films
Volume: 508
Issue / Number: 1-2
Start Page: 207
End Page: 212
Document Type: Article
ID: 306130.0
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