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X-ray μLaue: A novel view on fatigue damage at the micron scale
Authors: Kirchlechner, C.; Liegl, W.; Motz, C.; Dehm, G.
(Start) Date of Conference/Meeting
(YYYY-MM-DD):
 2013-10-06
Name of Conference/Meeting: ECI on Nanomechanical Testing 2013
Place of Conference/Meeting: Olhão (Algarve), Portugal
Document Type: Talk at Event
ID: 669715.0
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