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Computer-aided TEM analysis of precipitates in GaAs crystals
Authors: Kirmse, H.; Häusler, I.; Hähnert, I.; Neumann, W.; Scheerschmidt, K.; Kiessling, F. M.; Rudolph, P.
Place of Publication: Sapporo, Japan
Date of Publication (YYYY-MM-DD): 2006
Title of Proceedings: Proceedings 16th International Microscopy Congress
Start Page: 1448
Document Type: Conference-Paper
ID: 312910.0
Determination of composition and strain field of GaSbyAs1-yQds in InxGa1-xAs seed by means of qHRTEM
Authors: Otto, R.; Häusler, I.; Kirmse, H.; Neumann, W.; Pohl, U.W.; Bimberg, D.; Scheerschmidt, K.
Publisher: Belgian Society for Microscopy
Date of Publication (YYYY-MM-DD): 2004
Title of Proceedings: Proceedings 13th European Microscopy Congress
Start Page: 193
End Page: 194
Document Type: Conference-Paper
ID: 223897.0
Structural and analytical studies of nickel-based superalloys
Authors: Neumann, W.; Schneider, R.; Richter, U.; Schulze, C.; Schumacher, G.; Wanderka, N.; Bartsch, M.; Messerschmidt, U.
Date of Publication (YYYY-MM-DD): 2002
Title of Proceedings: Proceedings of the International Congress on Electron Microscopy (ICEM 15)
Start Page: 675
End Page: 676
Document Type: Conference-Paper
ID: 33451.0
Entries: 1-3  
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