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Hard X-ray photoelectron spectroscopy on buried,
off-stoichiometric CoxMnyGez (x : z = 2 : 0.38) Heusler thin films
Authors: Ouardi, S.; Fecher, G. H.; Chadov, S.; Balke, B.; Kozina, X.; Felser, C.; Taira, T.; Yamamoto, M.
Date of Publication (YYYY-MM-DD): 2013-01-25
Title of Journal: Applied Physics A
Volume: 111
Issue / Number: 2
Start Page: 395
End Page: 405
Document Type: Article
ID: 656162.0
Electronic structure and symmetry of valence states of epitaxial NiTiSn and NiZr0.5Hf0.5Sn thin films by hard x-ray photoelectron spectroscopy
Authors: Kozina, X.; Jaeger, T.; Ouardi, S.; Gloskowskij, A.; Stryganyuk, G.; Jakob, G.; Sugiyama, T.; Ikenaga, E.; Fecher, G. H.; Felser, C.
Date of Publication (YYYY-MM-DD): 2011-11-30
Title of Journal: Applied Physics Letters
Volume: 99
Issue / Number: 22
Start Page: 221908-1
End Page: 221908-3
Sequence Number of Article: 221908
Document Type: Article
ID: 576545.0
Entries: 1-2  
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