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Entries: 1-6  
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Wetting and crystallization at grain boundaries: origin of aluminum-induced crystallization of amorphous silicon.
Authors: Wang, J. Y.; He, D.; Zhao, Y. H.; Mittemeijer, E. J.
Date of Publication (YYYY-MM-DD): 2006
Title of Journal: Applied Physics Letters
Volume: 88
Sequence Number of Article: 061910
Document Type: Article
ID: 285119.0
X-ray diffraction analysis of the anisotropic nature of the structural imperfections in a sputter-deposited TiO2/Ti3Al bilayer.
Authors: Zhao, Y. H.; Welzel, U.; van Lier, J.; Mittemeijer, E. J.
Date of Publication (YYYY-MM-DD): 2006
Title of Journal: Thin Solid Films
Volume: 514
Start Page: 110
End Page: 119
Document Type: Article
ID: 285120.0
 
Full text / Content available
Microstructural changes in amorphous Si/crystalline Al thin bilayer films upon annealing
Authors: Zhao, Y. H.; Wang, J. Y.; Mittemeijer, E. J.
Date of Publication (YYYY-MM-DD): 2004-08
Title of Journal: Applied Phsics A
Volume: 79
Issue / Number: 3
Start Page: 681
End Page: 690
Document Type: Article
ID: 213940.0
Interaction of amorphous Si and crystalline Al thin films during low-temperature annealing in vaccum
Authors: Zhao, Y. H.; Wang, J. Y.; Mittemeijer, E. J.
Date of Publication (YYYY-MM-DD): 2003
Title of Journal: Thin Solid Films
Volume: 433
Start Page: 82
End Page: 87
Document Type: Article
ID: 47151.0
 
Full text / Content available
Determination of the interdiffusion coefficient for Si/Al multilayers by auger electron spectroscopical sputter depth profiling
Authors: Wang, J. Y.; Zalar, A.; Zhao, Y. H.; Mittemeijer, E. J.
Date of Publication (YYYY-MM-DD): 2003
Title of Journal: Thin Solid Films
Volume: 433
Start Page: 92
End Page: 96
Document Type: Article
ID: 47155.0
 
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Pressure induced structural transitions in nanocrystalline grained selenium
Authors: Liu, H. Z.; Jin, C. Q.; Zhao, Y. H.
Date of Publication (YYYY-MM-DD): 2002
Title of Journal: Physica B
Volume: 315
Issue / Number: 1-3
Start Page: 210
End Page: 214
Document Type: Article
ID: 7278.0
Entries: 1-6  
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