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Pindel: a pattern growth approach to detect break points of large deletions and medium sized insertions from paired-end short reads.
Authors: Ye, Kai; Schulz, Marcel H.; Long, Quan; Apweiler, Rolf; Ning, Zemin
Date of Publication (YYYY-MM-DD): 2009-06-26
Title of Journal: Bioinformatics
Volume: 25
Issue / Number: 21
Start Page: 2865
End Page: 2871
Document Type: Article
ID: 451276.0
 
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