Winkler, M., G. Kofod, R. Krastev, S. Stockle and M. Abel: Exponentially Fast Thinning of Nanoscale Films by Turbulent Mixing. In: Physical Review Letters 110, 9, Seq. No.: 094501 (2013).
Ranzinger, J., A. Rustom, M. Abel, J. Leyh, L. Kihm, M. Witkowski, P. Scheurich, M. Zeier and V. Schwenger: Nanotube action between human mesothelial cells reveals novel aspects of inflammatory responses. In: PLoS ONE 6, 12, Seq. No.: e29537 (2011).
doi: 0.1371/journal.pone.0029537
Abel, M.: Analyse TNT-basierter Netzwerke in permanenten und primären Zellkulturen mittels mikrostrukturierten Oberflächen. Doktorarbeit, Universität Heidelberg, Heidelberg (2008).
url: http://www.ub.uni-heidelberg.de/archiv/8382/
Abel, M.: Zelluläre Netzwerke auf Mikrostrukturen. Diplom, Universität Heidelberg, Heidelberg (2005).
Abel, M., G. D. Conway, H. Zohm and ASDEX Upgrade Team: Scaling and inverse scaling of ASDEX Upgrade reflectometer data. In: Proceedings of the 7th International Reflectometry Workshop for Fusion Plasma Diagnostics (IRW 7) Garching 9th-12th May, 2005, (Eds.) Conway, G.D. Max-Planck-Institut für Plasmaphysik, Garching (2005) 143-147.
url: http://www.aug.ipp.mpg.de/IRW/papers
Lin, N., A. Dmitriev, H. Spillmann, J. Weckesser, M. Abel, P. Messina, J. V. Barth and K. Kern: Observing and steering the formation of coordination compounds on surfaces at the single-molecule level. In: Proceedings `CLUSTERS AND NANO-ASSEMBLIES: Physical and Biological Systems', (Eds.) P. Jena, S.N. Khanna, B.K. Rao. World Scientific Publishing Co. Pte. Ltd., Singapore, Singapore (2005) 301-305.
Abel, M., A. Dmitriev, R. Fasel, N. Lin, J. V. Barth and K. Kern: Scanning tunneling microscopy and x-ray photoelectron diffraction investigation of C60 films on Cu(100). In: Physical Review B 67, 24, Seq. No.: 245407 (2003).
Messina, P., A. Dmitriev, N. Lin, H. Spillmann, M. Abel, J. V. Barth and K. Kern: Direct observation of chiral metal-organic complexes assembled on a Cu(100) surface. In: Journal of the American Chemical Society 124, 47, 14000-14001 (2002).
Kurths, J., U. Schwarz, A. Witt, R. T. Krampe and M. Abel: Measures of complexity in signal analysis. In: Chaotic, fractal, and nonlinear signal processing, (Eds.) R. A. Katz. AIP Conference Proceedings 375. American Institute of Physics, Woodbury, NY, USA (1996) 128-134.
localid: 4260b
Kurths, J., U. Schwarz, A. Witt, R. T. Krampe and M. Abel: Measures of complexity in signal analysis. In: Chaotic, fractal and nonlinear signal processing, (Eds.) R. A. Katz. AIP Conference Proceedings 375. American Institute of Physics (1996) 33-54.
localid: 4605c
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