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In situ mechanical testing in electron microscopes to study small scale deformation mechanisms
Authors: Kiener, D.; Oh, S. H.; Lee, S.; Jeong, J.; Minor, A. M.; Kunz, M.; Tamura, N.; Gruber, P. A.; Hoo, R. P.; Kirchlechner, C.; Alfreider, M.; Treml, R.
(Start) Date of Conference/Meeting
(YYYY-MM-DD):
 2013-10-06
Name of Conference/Meeting: ECI on Nanomechanical Testing 2013
Place of Conference/Meeting: Olhão (Algarve), Portugal
Document Type: Talk at Event
ID: 669716.0