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van Aken, P. A., C. T. Koch, W. Sigle, R. Höschen, M. Rühle, E. Essers, G. Benner and M. Matijevic: The sub-electron-volt-sub-Angstrom-microscope (SESAM): Pushing the limits in monochromated and energy-filtered TEM. In: Microscopy and Microanalysis 2007, (Eds.) Marko, M.; Scott, J.H. ; Vicenzi, E.; Dekanich, S.; Frafjord, J.; Kotula, P.; McKernan, V.; Shields, J. Cambridge University Press, New York, USA (2007) 862CD-863CD.
Essers, E., M. Matijevic, G. Benner, R. Höschen, W. Sigle and C. Koch: Analytical performance of the SESAM microscope. In: Microscopy & Microanalysis 13, Suppl. 3 (2007) 18-19.
Koch, C. T., W. Sigle, R. Höschen, M. Rühle, E. Essers, G. Benner and M. Matijevic: SESAM: Exploring the frontiers of electron microscopy. In: Microscopy and Microanalysis 12, 6, 506-514 (2006).
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Sigle, W., V. Srot, L. Gu, C. T. Koch, R. Höschen, E. Essers, M. Matijevic, G. Benner, A. Thesen and M. Rühle: Low-loss electron spectroscopy using monochromated electrons. In: Proceedings of the 16th International Microscopy Congress 2006 International Federation of Societies in Microscopy (2006) 811-811.
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