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Understanding STM images and EELS spectra of oxides with strongly correlated electrons: a comparison of nickel and uranium oxides
Authors: Dudarev, S. L.; Castell, M. R.; Botton, G. A.; Savrasov, S. Y.; Muggelberg, C.; Briggs, G. A. D.; Sutton, A. P.; Goddard, D. T.
Date of Publication (YYYY-MM-DD): 2000
Title of Journal: Micron
Volume: 31
Start Page: 363
End Page: 372
Document Type: Article
ID: 181427.0