Capiod, P., T. Xu, J. P. Nys, M. Berthe, G. Patriarche, L. Lymperakis, J. Neugebauer, P. Caroff, R. E. Dunin-Borkowski, P. Ebert and B. Grandidier: Band offsets at zincblende-wurtzite GaAs nanowire sidewall surfaces. In: Applied Physics Letters 103, Applied Physics Letters, 122104-1-122104-4 (2013).
doi: 10.1063/1.4821293
Lymperakis, L., P. H. Weidlich, H. Eisele, M. Schnedler, J.-P. Nys, B. Grandidier, D. Stievenard, R. Dunin-Borkowski, J. Neugebauer and P. Ebert: Revealing Hidden Surface States of Non-Polar GaN Facets by an Ab Initio Tailored STM Approach. (10th International Conference on Nitride Semiconductors, 2013-08-25 to 2013-08-30, Washigton DC, USA).
Shukla, A. K., R. S. Dhaka, S. W. D’Souza, M. Maniraj, S. R. Barman, K. Horn, P. Ebert, K. Urban, D. Wu and T. A. Lograsso: Manganese adlayers on i-Al-Pd-Mn quasicrystal: growth and electronic structure. In: Journal of Physics Condensed Matter 21, 405005-1-405005-8 (2009).
doi: 10.1088/0953-8984/21/40/405005
url: http://www.iop.org/EJ/abstract/0953-8984/21/40/405005
Resch-Genger, U., K. Hoffmann, W. Nietfeld, A. Engel, J. Neukammer, R. Nitschke, P. Ebert and R. Macdonald: How to improve quality assurance in fluorometry : fluorescence-inherent sources of error and suited fluorescence standards. In: Journal of Fluorescence 15, 3, 337-362 (2005).
doi: 10.1007/s10895-005-2630-3
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