Liu, N., T. Weiss, M. Mesch, L. Langguth, U. Eigenthaler, M. Hirscher, C. Sönnichsen and H. Giessen: Planar metamaterial analogue of electromagnetically induced transparancy for plasmonic sensing. In: Nano Letters 10, 1103-1107 (2010).
doi: 10.1021/nl90221d
Faridian, A., D. Hopp, G. Pedrini, U. Eigenthaler, M. Hirscher and W. Osten: Nanoscale imaging using deep ultraviolet digital holographic microscopy. In: Optics Express 18, 13, 14159-14164 (2010).
doi: 10.1364/OE.18.014159
Rahmati, B., W. Sigle, J. Fleig, M. Konuma, U. Eigenthaler, C. Koch, P. A. van Aken and M. Rühle: Effect of surface orientation on island formation on SrTiO3 surfaces. In: Journal of Physics: Conference Series 94, Seq. No.: 012013 (2008).
Rahmati, B., W. Sigle, J. Fleig, M. Konuma, U. Eigenthaler, C. Koch, P. A. van Aken and M. Rühle: Effect of surface orientation on island formation on SrTiO3 surfaces. In: Journal of Physics: Conference Series 94, Seq. No.: 012013 (2008).
Rahmati, B., W. Sigle, J. Fleig, M. Konuma, U. Eigenthaler, C. Koch, P. A. van Aken and M. Rühle: Effect of surface orientation on island formation on SrTiO3 surfaces. In: Journal of Physics: Conference Series 94, Seq. No.: 012013 (2008).
Deneke, C., W. Sigle, U. Eigenthaler, P. A. van Aken, G. Schütz and O. G. Schmidt: Interfaces in semiconductor/metal radial superlattices. In: Applied Physics Letters 90, Seq. No.: 263107 (2007).
Deneke, C., W. Sigle, U. Eigenthaler, P. A. van Aken, G. Schütz and O. G. Schmidt: Interfaces in semiconductor/metal radial superlattices. In: Applied Physics Letters 90, Seq. No.: 263107 (2007).
Sigle, W., S. Krämer, V. Varshney, A. Zern, U. Eigenthaler and R. Rühle: Plasmon energy mapping in energy-filtering transmission electron microscopy. In: Ultramicroscopy 96, 565-571 (2003).
Sigle, W., S. Krämer, A. Zern, Y. Cai, U. Eigenthaler, K. Hahn and M. Rühle: The SESAM Project - Present State and Applications. In: Proceedings of the 15th International Congress on Electron Microscopy. Vol. 1, (Eds.) Engelbrecht, J.; Sevell, T.; Witcomb, M.; Cross, R.; Richards, P. Microscopy Society of Southern Africa, Onderstepoort (2002) 329-330.
Sigle, W., A. Zern, K. Hahn, U. Eigenthaler and M. Rühle: Advances in energy-filtering transmission electron microscopy. In: Journal of Electron Microscopy 50, 6, 509-515 (2001).
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