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Electronic structure and symmetry of valence states of epitaxial NiTiSn and NiZr0.5Hf0.5Sn thin films by hard x-ray photoelectron spectroscopy
Authors: Kozina, X.; Jaeger, T.; Ouardi, S.; Gloskowskij, A.; Stryganyuk, G.; Jakob, G.; Sugiyama, T.; Ikenaga, E.; Fecher, G. H.; Felser, C.
Date of Publication (YYYY-MM-DD): 2011-11-30
Title of Journal: Applied Physics Letters
Volume: 99
Issue / Number: 22
Start Page: 221908-1
End Page: 221908-3
Sequence Number of Article: 221908
Document Type: Article
ID: 576545.0