Engelhardt, J., J. Keller, P. Hoyer, M. Reuss, T. Staudt and S. W. Hell: Molecular orientation affects localization accuracy in superresolution far-field fluorescence microscopy.. In: Nano Letters 11, 1, 209-213 (2010).
url: http://pubs.acs.org/doi/pdfplus/10.1021/nl103472b
Hoyer, P., T. Staudt, J. Engelhardt and S. W. Hell: Quantum dot blueing and blinking enables fluorescence nanoscopy.. In: Nano Letters 11, 1, 245-250 (2010).
url: http://pubs.acs.org/doi/pdfplus/10.1021/nl103639f
Janzing, D., P. Hoyer and B. Schölkopf: Telling cause from effect based on high-dimensional observations. In: Proceedings of the 27th International Conference on Machine Learning (ICML 2010) (2010) 479-486.
url: http://www.icml2010.org/
localid: 6501
Hyvärinen, A., K. Zhang, S. Shimizu and P. Hoyer: Estimation of a Structural Vector Autoregression Model Using Non-Gaussianity. In: Journal of Machine Learning Research 11, 1709-1731 (2010).
url: http://jmlr.csail.mit.edu/papers/v11/hyvarinen10a.html
localid: 6627
http://edoc.mpg.de
The Max Planck Society does not take any responsibility for the content of this export.