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Strain and composition distribution in uncapped SiGe islands from x-ray diffraction
Authors: Stangl, J.; Daniel, A.; Holý, V.; Roch, T.; Bauer, G.; Kegel, I.; Metzger, T. H.; Wiebach, T.; Schmidt, O. G.; Eberl, K.
Date of Publication (YYYY-MM-DD): 2001
Title of Journal: Applied Physics Letters
Volume: 79
Start Page: 1474
End Page: 1476
Document Type: Article
ID: 182745.0


Vertical correlation of SiGe islands in SiGe/Si superlattices: X-ray diffraction versus transmission electron microscopy
Authors: Stangl, J.; Roch, T.; Bauer, G.; Kegel, I.; Metzger, T. H.; Schmidt, O. G.; Eberl, K.; Kienzle, O.; Ernst, F.
Date of Publication (YYYY-MM-DD): 2000
Title of Journal: Applied Physics Letters
Volume: 77
Start Page: 3953
End Page: 3955
Document Type: Article
ID: 181880.0