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Micro-heterogeneity study of trace elements in USGS, MPI-DING and NIST glass reference materials by means of synchrotron micro-XRF
Authors: Kempenaers, L.; Janssens, K.; Jochum, K. P.; Vincze, L.; Vekemans, B.; Somogyi, A.; Drakopoulos, M.; Adams, F.
Date of Publication (YYYY-MM-DD): 2003
Title of Journal: Journal of Analytical Atomic Spectrometry
Volume: 18
Issue / Number: 4
Start Page: 350
End Page: 357
Document Type: Article
ID: 120095.0