The MOS-type DEPFET pixel sensor for the ILC environment |
Authors: Andricek, L.; Fischer, P.; Heinzinger, K.; Herrmann, S.; Herz, D.; Karagounis, M.; Kohrs, R.; Krüger, H.; Lechner, P.; Lutz, G.; Moser, H. G.; Peric, I.; Reuen, L.; Richter, R. H.; Sandow, C.; Schnecke, M.; Schopper, F.; Strüder, L.; Törne, E. V.; Treis, J.; Trimpl, M.; Velthuis, J.; Wermes, N.; Wölfel, S. | Date of Publication (YYYY-MM-DD): 2006-09-01 | Name of Conference/Meeting: International Workshop on Semiconductor Pixel Detectors for Particles and Imaging | Title of Journal: Nuclear Instruments and Methods in Physics Research Section A-Accelerators Spectrometers Detectors and Associated Equipment | Volume (in Journal): 565 | Issue / Number: 1 | Start Page: 165 | End Page: 171 | Document Type: Conference-Paper | ID: 288742.0 |
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