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Fabrication, characterization and modeling of strained SOI MOSFETs with very large effective mobility.
Authors: Driussi, F.; Esseni, D.; Selmi, L.; Schmidt, M.; Lemme, M. C.; Kurz, H.; Buca, D.; Mantl, S.; Luysberg, M.; Loo, R.; Nguyen, D.; Reiche, M.
Date of Publication (YYYY-MM-DD): 2007
Title of Proceedings: Proceedings of the 37th European Solid-State Device Reseach Conference (ESSDERC 2007)
Start Page: 315
End Page: 318
Document Type: Conference-Paper
ID: 350320.0