Mayer, M., W. Eckstein, H. Langhuth, F. Schiettekatte, U. von Toussaint and F. Mathis: Computer Simulation of Ion Beam Analysis: Possibilities and Limitations. (Seminar Talk, Peking University, 2012-11-14, Beijing).
Mayer, M., U. von Toussaint, J. Dewalque, O. Dubreuil, C. Henrist, R. Cloots and F. Mathis: Rutherford backscattering analysis of porous thin TiO2 films. In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 273, 83-87 (2012).
doi: 10.1016/j.nimb.2011.07.045
url: http://dx.doi.org/10.1016/j.nimb.2011.07.045
Mayer, M., U. von Toussaint, J. Dewalque, O. Dubreuil, C. Henrist, R. Cloots and F. Mathis: Ion beam analysis of porous thin films. (20th International Conference on Ion Beam Analysis (IBA 2011), 2011-04-10 to 2011-04-15, Itapema, SC).
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