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Computer Simulation of Ion Beam Analysis: Possibilities and Limitations
Authors: Mayer, M.; Eckstein, W.; Langhuth, H.; Schiettekatte, F.; Toussaint, U. von; Mathis, F.
(Start) Date of Conference/Meeting
(YYYY-MM-DD):
 2012-11-14
Name of Conference/Meeting: Seminar Talk, Peking University
Place of Conference/Meeting: Beijing
Document Type: Talk at Event
ID: 628171.0


Rutherford backscattering analysis of porous thin TiO2 films
Authors: Mayer, M.; von Toussaint, U.; Dewalque, J.; Dubreuil, O.; Henrist, C.; Cloots, R.; Mathis, F.
Date of Publication (YYYY-MM-DD): 2012
Title of Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Volume: 273
Start Page: 83
End Page: 87
Document Type: Article
ID: 587802.0


Ion beam analysis of porous thin films
Authors: Mayer, M.; von Toussaint, U.; Dewalque, J.; Dubreuil, O.; Henrist, C.; Cloots, R.; Mathis, F.
(Start) Date of Event
(YYYY-MM-DD):
 2011-04-10
Name of Conference/Meeting: 20th International Conference on Ion Beam Analysis (IBA 2011)
Document Type: Poster
ID: 522282.0