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Overview of the calibration and the performance of the PN-CCD camera
Authors: Briel, Ulrich G.; Bihler, E.; Bräuninger, H.; Colli, M.; Dennerl, K.; Haberl, F.; Hartmann, R.; Hartner, G.; Holl, P.; Meidinger, N.; Kemmer, J.; Kendziorra, E.; Kirsch, M.; Krause, N.; Kuster, M.; Pal, J.; Pfeffermann, E.; Popp, M.; Reppin, C.; Stadelbauer, Th.; Soltau, H.; Strüder, L.; Trümper, J.; v. Zanthier, Ch.; Zavlin, V. E.
Place of Publication: Bellingham, Wash., USA
Publisher: Society of Photo-Optical Instrumentation Engineers
Date of Publication (YYYY-MM-DD): 1999
Name of Conference/Meeting: EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X
Title of Proceedings: EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X
Start Page: 215
End Page: 219
Title of Series: Proceedings of SPIE
Volume (in Series): 3765
Document Type: Conference-Paper
ID: 294747.0


The influence of optical light on the charge transfer efficiency of the XMM EPIC pn-CCD camera
Authors: Pal, J.; Kuster, M.; Kendziorra, E.; Krause, N.
Place of Publication: Bellingham, Wash., USA
Publisher: Society of Photo-Optical Instrumentation Engineers
Date of Publication (YYYY-MM-DD): 1999
Name of Conference/Meeting: EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X
Title of Proceedings: EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X
Start Page: 683
End Page: 692
Title of Series: Proceedings of SPIE
Volume (in Series): 3765
Document Type: Conference-Paper
ID: 294764.0