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A DEPFET Based Beam Telescope with Submicron Precision Capability
Authors: Velthuis, J. J.; Drasal, Z.; Hanninger, G.; Kohrs, R.; Mathes, M.; Reuen, L.; Scheireich, D.; Andricek, L.; Pascual, I. C.; Chen, X.; Dolezal, Z.; Fischer, P.; Frey, A.; Fuster, J. A.; Koch, M.; Kodys, P.; Kvasnicka, P.; Krueger, H.; Llacer, C. L.; Lodomez, P.; Moser, H. G.; Peric, I.; Raspereza, A.; Richter, R.; Rummel, S.; von Toerne, E.; Wermes, N.
Date of Publication (YYYY-MM-DD): 2008
Title of Journal: IEEE Transactions on Nuclear Science
Issue / Number: 55
Start Page: 662
End Page: 666
Document Type: Conference-Paper
ID: 543289.0