Mehrtens, T., M. Schowalter, D. Tytko, P. Choi, D. Raabe, L. Hoffmann, H. J├Ânen, U. Rossow, A. Hangleiter and A. Rosenauer: Measurement of the indium concentration in high indium content InGaN layers by scanning transmission electron microscopy and atom probe tomography. In: Applied Physics Letters 102, 13, , Seq. No.: 132112 (2013).
url: dx.doi.org/10.1063/1.4799382
Mehrtens, T., S. Bley, M. Schowalter, K. Sebald, M. Seyfried, J. Gutowski, S. A. Gerstl, P. Choi, D. Raabe and A. Rosenauer: A (S)TEM and atom probe tomography study of InGaN. In: Journal of Physics, Conference Series 326, 012029 (2011) 1-4.
url: http://iopscience.iop.org/1742-6596/326/1/012029
doi: 10.1088/1742-6596/326/1/012029
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