Choi, P., O. Cojocaru-Mirédin, D. Abou-Ras, R. Caballero, D. Raabe, V. Smentkowski, C. G. Park, G. H. Gu, B. Mazumder, M. H. Wong, Y.-L. Hu, T. P. Melo and J. S. Speck: Atom-Probe Tomography of compound semiconductors for photovoltaic and light-emitting device applications. In: Microscopy Today 20, 3, 18-24 (2012).
Yang, L., N. Shirahata, G. Saini, F. Zhang, L. Pei, M. C. Asplund, D. G. Kurth, K. Ariga, K. Sautter, T. Nakanishi, V. Smentkowski and M. R. Linford: Effect of Surface Free Energy on PDMS Transfer in Microcontact Printing and Its Application to ToF-SIMS to Probe Surface Energies. In: Langmuir 25, 10, 5674-5683 (2009).
http://edoc.mpg.de
The Max Planck Society does not take any responsibility for the content of this export.