Kempenaers, L., K. Janssens, K. P. Jochum, L. Vincze, B. Vekemans, A. Somogyi, M. Drakopoulos and F. Adams: Micro-heterogeneity study of trace elements in USGS, MPI-DING and NIST glass reference materials by means of synchrotron micro-XRF. In: Journal of Analytical Atomic Spectrometry 18, 4, 350-357 (2003).
The Max Planck Society does not take any responsibility for the content of this export.