Chu, Y. Y., Y. F. Liao, V. T. Tra, J. C. Yang, W. Z. Liu, Y. H. Chu, J. Y. Lin, J. H. Huang, J. Weinen, S. Agrestini, K.-D. Tsuei and D. J. Huang: Distribution of electronic reconstruction at the n-type LaAlO3/SrTiO3 interface revealed by hard x-ray photoemission spectroscopy. In: Applied Physics Letters 99, 26, 262101-1-262101-3, Seq. No.: 262101 (2011).
doi: 10.1063/1.3672099
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