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Prerequisites for a Cc/Cs-corrected ultrahigh-resolution TEM
Authors: Haider, M.; Müller, H.; Uhlemann, S.; J. Zach, J.; Löbau, U.; Höschen, R.
Date of Publication (YYYY-MM-DD): 2008
Title of Journal: Ultramicroscopy
Volume: 108
Start Page: 167
End Page: 178
Document Type: Article
ID: 362409.0


Progress on the development of a Cc/Cs corrector for TEAM
Authors: Haider, M.; Hartel, P.; Löbau, U.; Höschen, R.; Müller, H.; Uhlemann, S.; Kahl, F.; Zach, J.
Date of Publication (YYYY-MM-DD): 2008
Name of Conference/Meeting: Microscopy and Microanalysis 2008
Title of Journal: Microscopy and Microanalysis
Volume (in Journal): 14
Issue / Number: Supplement S2
Start Page: 800CD
End Page: 801CD
Document Type: Conference-Paper
ID: 372671.0


State of the development of a Cc & Cs corrector for TEAM
Authors: Haider, M.; Loebau, U.; Höschen, R.; Müller, H.; Uhlemann, S.; Zach, J.
Place of Publication: New York, USA
Publisher: Cambridge University Press
Date of Publication (YYYY-MM-DD): 2007
Name of Conference/Meeting: Microscopy and Microanalysis 2007
Title of Proceedings: Microscopy and Microanalysis 2007
Start Page: 1156CD
End Page: 1157CD
Document Type: Conference-Paper
ID: 319196.0