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Sensitivity study of the SX tomography system on Wendelstein 7-X
Authors: Thomsen, H.; Bergmann, T.; Biedermann, C.; Dinklage, A.; König, R.; Li, D.; Marquardt, M.; Meisel, F.; Sachtleben, J.; Schülke, M.; Sieber, T.; Svensson, J.; Vorkörper, A.; Weißflog, S.; Weller, A.; Zacharias, D.; Zhang, D.
Place of Publication: Geneva
Publisher: European Physical Society
Date of Publication (YYYY-MM-DD): 2012
Name of Conference/Meeting: 39th EPS Conference on Plasma Physics and 16th International Congress on Plasma Physics
Title of Proceedings: 39th European Physical Society Conference on Plasma Physics and 16th International Congress on Plasma Physics. Contributed Papers
Sequence Number: P2.011
Title of Series: ECA
Volume (in Series): 36F
Document Type: Conference-Paper
ID: 624861.0