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Determining oxygen isotope profiles in oxides with Time-of-Flight SIMS
Authors: De Souza, R. A.; Zehnpfenning, J.; Martin, M.; Maier, J.
Date of Publication (YYYY-MM-DD): 2005
Title of Journal: Solid State Ionics
Volume: 176
Issue / Number: 15-16
Start Page: 1465
End Page: 1471
Document Type: Article
ID: 244488.0