Wang, J. Y., D. He, Y. H. Zhao and E. J. Mittemeijer: Wetting and crystallization at grain boundaries: origin of aluminum-induced crystallization of amorphous silicon.. In: Applied Physics Letters 88, Seq. No.: 061910 (2006).
Zhao, Y. H., U. Welzel, J. van Lier and E. J. Mittemeijer: X-ray diffraction analysis of the anisotropic nature of the structural imperfections in a sputter-deposited TiO2/Ti3Al bilayer.. In: Thin Solid Films 514, 110-119 (2006).
Zhao, Y. H., J. Y. Wang and E. J. Mittemeijer: Microstructural changes in amorphous Si/crystalline Al thin bilayer films upon annealing. In: Applied Phsics A 79, 3, 681-690 (2004).
Zhao, Y. H., J. Y. Wang and E. J. Mittemeijer: Interaction of amorphous Si and crystalline Al thin films during low-temperature annealing in vaccum. In: Thin Solid Films 433, 82-87 (2003).
Wang, J. Y., A. Zalar, Y. H. Zhao and E. J. Mittemeijer: Determination of the interdiffusion coefficient for Si/Al multilayers by auger electron spectroscopical sputter depth profiling. In: Thin Solid Films 433, 92-96 (2003).
Liu, H. Z., C. Q. Jin and Y. H. Zhao: Pressure induced structural transitions in nanocrystalline grained selenium. In: Physica B 315, 1-3, 210-214 (2002).
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