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Measuring nanomechanical motion with an imprecision below that at the standard quantum limit
Authors: Anetsberger, G.; Verlot, P.; Gavartin, E.; Arcizet, O.; Unterreithmeier, Q. P.; Weig, E. M.; Gorodetsky, M. L.; Kotthaus, J. P.; Kippenberg, T. J.
Publisher: IEEE
Date of Publication (YYYY-MM-DD): 2011
Name of Conference/Meeting: 2011 Conference on Lasers and Electro-Optics (CLEO)
Title of Proceedings: CLEO
Document Type: Conference-Paper
ID: 609010.0