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          Document History for Document ID 173768

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Document Version Version Comment Date Status
173768.0 [No comment] 13.10.2014 16:29 Released

ID: 173768.0, MPI für Dynamik und Selbstorganisation / Atom- und Molekülphysik
Ellipsometric study of silicon nanocrystal optical constants
Authors:Amans, D.; Callard, S.; Gagnaire, A.; Joseph, J.; Ledoux, G.; Huisken, F.
Language:English
Date of Publication (YYYY-MM-DD):2003-04-01
Title of Journal:Journal of Applied Physics
Journal Abbrev.:J. Appl. Phys.
Volume:93
Issue / Number:7
Start Page:4173
End Page:4179
Review Status:not specified
Audience:Not Specified
External Publication Status:published
Document Type:Article
Communicated by:Folkert Müller-Hoissen
Affiliations:MPI für Dynamik und Selbstorganisation
External Affiliations:Ecole Cent Lyon, LEOM, CNRS, UMR 5512, F-69131 Ecully, France.
Identifiers:ISI:000181729600066 [ID No:1]
ISSN:0021-8979 [ID No:2]