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          Document History for Document ID 230631

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Document Version Version Comment Date Status
230631.0 [No comment] 12.07.2005 13:00 Released

ID: 230631.0, Fritz-Haber-Institut / Molecular Physics
Valence band discontinuity at the GaN/SiC(0001) heterojunction studied in situ by synchrotron-radiation photoelectron spectroscopy
Authors:Chen, Chia Hao; Aballe, Lucia; Klauser, Ruth; Kampen, Thorsten U.; Horn, Karsten
Language:English
Date of Publication (YYYY-MM-DD):2005-03-07
Title of Journal:Journal of Electron Spectroscopy and Related Phenomena
Journal Abbrev.:J. Electron Spectrosc.& Relat. Phenom.
Volume:144-147
Start Page:425
End Page:428
Copyright:2005 Elsevier B. V.
Review Status:Peer-review
Audience:Experts Only
Abstract / Description:The valence band discontinuity and the interface formation of the n-type hexagonal GaN/SiC(0 0 0 1) heterointerface have been studied by means of angle-resolved photoelectron spectroscopy using synchrotron radiation. Gallium nitride thin films were grown on SiC(0 0 0 1) substrates by molecular beam epitaxy using either nitrogen plasma or ammonia gas as nitrogen source. The interface properties were investigated in situ by a combination of core level and valence band spectroscopy. The interface formation and the valence band offset of the epitaxial GaN films grown by the two methods have been compared. The GaN/SiC interface shows Si±0.1 eV for the ammonia grown films and 1.10±0.1 eV for the nitrogen plasma grown films. These values are in good agreement with the theoretical prediction and indicate that the band alignment of the GaN/SiC heterojunction is of the staggered type.
Free Keywords:Angle-resolved photoelectron spectroscopy; GaN/SiC heterojunction
External Publication Status:published
Document Type:Article
Communicated by:Gerard Meijer
Affiliations:Fritz-Haber-Institut/Molecular Physics
External Affiliations:National Synchrotron Radiation Research Center, Hsinchu 30077, Taiwan;
Sincrotrone Trieste, Area Science Park-Basovizza, I-34012 Trieste, Italy;Technische Universität Chemnitz, D-09107 Chemnitz, Germany
Identifiers:URL:http://www.sciencedirect.com/science?_ob=ArticleUR...
DOI:10.1016/j.elspec.2005.01.056