Please note that eDoc will be permanently shut down in the first quarter of 2021!      Home News About Us Contact Contributors Disclaimer Privacy Policy Help FAQ

Home
Search
Quick Search
Advanced
Fulltext
Browse
Collections
Persons
My eDoc
Login
Name:
Password:
Documentation
Help
Support Wiki
Direct access to
document ID:


          Document History for Document ID 446606

Back to latest document version
Document Version Version Comment Date Status
446606.0 [No comment] 09.02.2010 10:06 Released

ID: 446606.0, MPI für Eisenforschung GmbH / Interface Chemistry and Surface Engineering
Simulation of probing the electric double layer by scanning electrochemical potential microscopy (SECPM)
Authors:Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.
Language:English
Name of Conference/Meeting:11th International Fischer Symposium on Microscopy in Electrochemistry
Place of Conference/Meeting:Benediktbeuern, Germany
(Start) Date of Conference/Meeting
 (YYYY-MM-DD):
2009-07
End Date of Conference/Meeting 
 (YYYY-MM-DD):
2009-07
Document Type:Talk at Event
Affiliations:MPI für Eisenforschung GmbH