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          Document History for Document ID 563644

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Document Version Version Comment Date Status
563644.0 Automatic journal name synchronization 03.03.2012 20:15 Released

ID: 563644.0, MPI für Plasmaphysik / Articles, Books, Inbooks
Analysis of Depth Profiles of Hydrogen Isotopes in Structural Materials via Reflected Electron Spectroscopy
Authors:Afanas'ev, V. P.; Afanas'ev, M. V.; Batrakov, A. A.; Bohmeyer, W.; Naujoks, D.; Lubenchenko, A. V.; Markin, A.
Language:English
Date of Publication (YYYY-MM-DD):2011
Title of Journal:Journal of Surface Investigation: x-ray, Synchrotron and Neutron Techniques
Volume:53
Issue / Number:1
Start Page:70
End Page:74
Copyright:Pleiades Publishing, Ltd.
Review Status:Peer-review
Audience:Experts Only
Comment of the Author/Creator:Original Russian Text © V.P. Afanas’ev, M.V. Afanas’ev, A.A. Batrakov, W. Bohmeyer, D. Naujoks, A.V. Lubenchenko, A. Markin, 2011, published in Poverkhnost’. Rentgenovskie,
Sinkhrotronnye i Neitronnye Issledovaniya, No. 1, pp. 76–80.
External Publication Status:published
Document Type:Article
Version Comment:Automatic journal name synchronization
Communicated by:N. N.
Affiliations:MPI für Plasmaphysik/AG Plasma Diagnostics (HU Berlin)
MPI für Plasmaphysik/W7-X Project Control (W7-X PC)
External Affiliations:Moscow Power Engineering Institute (Technical University), Moscow, Russia;
Department of Electronics and Informatics, MATI, Moscow, Russia;
Institute of Physical Chemistry and Electrochemistry, Russian Academy of Sciences, Moscow, Russia
Identifiers:DOI:10.1134/S1027451011010034
URL:http://dx.doi.org/10.1134/S1027451011010034